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Pages 1–40 ToF-SIMS - An Overview John C.
Vickerman
Surface Analysis Research Centre, Department of Chemistry, UMIST, Manchester, UK
Pages 41–72 The History of Static SIMS: A Personal Perspective Alfred
Benninghoven
Physikalisches Institut der Universitä:t Münster, Germany
Pages 75–94 Time-of-Flight Mass Analysers Bruno W.
Schueler
Physical Electronics, 810 Kifer Road, Sunnyvale, CA 94086, USA
Pages 95–111 Primary Ion Beam Systems Rowland Hill
Ionoptika
Ltd, Epsilon House, Chilworth Science Park, Southampton SO16 7NS, UK
Pages 113–135 Sample Handling D. Fraser Reich
Physical
Electronics, 810 Kifer Road, Sunnyvale, CA 94086, USA
Pages 139–159 Status of Cascade Theory Herbert M.
Urbassek
Fachbereich Physik, Universität Kaiserlautern, Erwin-Schrödinger-Straße, D-67663 Kaiserlautern, Germany
Pages 161–194 Fundamental Aspects of Organic SIMS Arnaud
Delcorte
Unité de Physico-Chimie et de Physique des Matériaux, Université Catholique de Louvain, 1 Croix du Sud, B-1348 Louvain-la-
Neuve, Belgium
Pages 195–222 Fundamental Aspects of Inorganic SIMS Annemie
Adriaens, Rita Van Ham and Luc Van Vaeck
Department of Chemistry, University of Antwerp, Universiteitsplein 1, B-2610 Antwerp, Belgium
Pages 223–257 Molecular Dynamics Simulations, the Theoretical Partner to Static
SIMS Experiments Barbara J. Garrison
Department of Chemistry, Penn State University, University Park, PA 16802, USA
Pages 261–283 Optimisation of Operating Conditions Ian
Gilmore
Centre for Optical and Environmental Mterology, National Physical Laboratory, Teddington, UK
Pages 285–308 Optimisation Methods: Cationisation Birgit
Hagenhoff
TASCON GmbH, Mendelstr. 11, 48149 Münster, Germany
Pages 309–345 Polyatomic Primary Beams Michael J. van
Stipdonk
Department of Chemistry, Wichita State University, KS 67260-0051, USA
Pages 347–373 Laser Post-Ionisation: Fundamentals Andreas
Wucher
Institute of Experimental Physics, University of Essen, D-45117 Essen, Germany
Pages 375–415 Laser Post-ionisation for Quantitative Elemental Analysis Michael J. Pellin, Wallis F. Calaway and Igor V. Veryovkin
Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439, USA
Pages 417–443 Laser Post-Ionisation for Molecular Analysis Nicholas P.
Lockyer
Surface Analysis Research Centre, Department of Chemistry, UMIST, Manchester, M60 1QD, UK
Pages 447–493 Interpretation of Spectra David Briggs
Centre for
Surface Chemical Analysis, University of Nottingham, University Park, Nottingham, NG7 2RD, UK
Pages 475–493 ToF-SIMS Image Analysis Bonnie J.
Tyler
Department of Chemical and Fuels Engineering, University of Utah, Salt Lake City, UT 84112, USA
Pages 497–524 Surface Characterisation of Polymers David
Briggs
Centre for Surface Chemical Analysis, University of Nottingham, University Park, Nottingham, NG7 2RD, UK
Pages 525–542 Analysis of Bulk Polymers Alan A.
Galuska
ExxonMobil Chemical Company, Baytown Polymers Center, 5200 Baytown Drive, Baytown, TX 77520-2101, USA
Pages 543–571 Quantitative Characterisation of Polymer Surfaces Xavier
Vanden Eynde
Université Catholique de Louvain, Unité PCPM, B-1348 Louvain-la-Neuve, Belgium
Pages 573–593 Studies of Self-Assembled Monolayers Graham J.
Leggett
Department of Chemistry, University of Manchester, Institute of Science and Technology, PO Box 88, Manchester, M60 1QD, UK
Pages 595–626 Biological Systems Jamal I. Berry, Andrew G. Ewing
and Nicholas Winograd
Department of Chemistry and the Materials Research Institute, Penn State University, 184 Materials Research Institute, University Park, PA
16802, USA
Pages 627–650 Biomolecules on Surfaces Ashutosh
Chilkoti
Department of Biomedical Engineering, Campus Box 90281, Duke University, Durham, NC 27708, USA
Pages 651–672 Atmospheric Chemistry Heather A.
Gamble
Unisearch Associates Inc., 96 Bradwick Drive, Concord, Ontario, Canada, L4K 1K8
Pages 673–695 Contamination Monitoring and Failure Analysis Thomas
Fister, Thomas Schuerlein and Patricia Lindley
Charles Evans & Associates, 810 Kifer Road, Sunnyvale, CA 94086, USA
Pages 697–725 Applications in Catalysis Marco J.P. Hopstaken, Ralf
Linke, Wouter J. H. van Gennip and J.W. (Hans) Niemantsverdriet
Schuit Institute of Catalysis, Eindhoven University of Technology, 5600 MB Eindhoven, The
Netherlands
Pages 727–752 Photographic Materials Geert Verlinden, Renaat
Gijbels and Ingrid Geuens
Department of Chemistry, University of Antwerp, Universiteitsplein 1, B-2610 Wilrijk, Belgium
Agfa Gevaert NV, B-2640 Mortsel,
Belgium
Pages 753–778 Dual Beam Depth Profiling Ewald Niehuis and Thomas
Grehl
ION-TOF GmbH, Mendelstr 11, 48149 Münster, Germany
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