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| Surface Analysis |
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Surface Analysis by Auger and X-Ray Photoelectron Spectroscopy
If Briggs and Seah has been your guide in the past, you will want this book.
Auger Electron Spectroscopy (AES) and X-ray Photoelectron Spectroscopy (XPS or ESCA) are well-established techniques for surface analysis and also (when combined with sputter depth profiling) for thin fil...
Price: £180.00
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ToF-SIMS: Surface Analysis by Mass Spectrometry
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is the most versatile of the surface analysis techniques that have been developed during the last 30 years. Current instrumentation provides a powerful combination of capabilities for molecular detection and trace element determination, im...
Price: £180.00
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