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If “Briggs and Seah” has been your guide in the past, you will want this book.

Auger Electron Spectroscopy (AES) and X-ray Photoelectron Spectroscopy (XPS or ESCA) are well-established techniques for surface analysis and also (when combined with sputter depth profiling) for thin film and interface analysis.

This book is the first comprehensive treatment of the subject for over 10 years, during which time there have been many advances in instrumentation and performance, understanding of electron spectroscopy fundamentals, experimental methodology and data interpretation, which have markedly enhanced the capabilities of AES and XPS. All this new information is now integrated into a thoroughly up-to-date reference volume for the benefit of researcher and practical analyst alike.

31 chapters cover the following areas: perspectives and history; basic principles and spectral features; instrumentation, sample handling and beam effects; electron transport and surface sensitivity; quantification; spectral interpretation and structural effects; depth profiling; imaging; developing aspects. There are also extensive Appendices of reference data.

The authors are all internationally recognised and come from Australia, Europe, Japan and the USA.

See the Contents list.

The hardback book costs: £180.00 plus Postage & Packing.  

ISBN 1 901019 04 7