Books in Surface Analysis
IM Publications and SurfaceSpectra are jointly publishing a series of books on Surface Analysis. The first in the series is ToF-SIMS: Surface Analysis by Mass Spectrometry and the latest is Surface Analysis by Auger and X-Ray Photoelectron Spectroscopy.
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is the most versatile of the surface analysis techniques that have been developed during the last 30 years. Current instrumentation provides a powerful combination of capabilities for molecular detection and trace element determination, imaging and microanalysis, and shallow depth profiling. This is the first book to be dedicated to the subject and the treatment is comprehensive.
All the contributors are internationally recognised as leaders in their respective fields and come from both Europe and the USA.
If Briggs and Seah has been your guide in the past, you will want this book.
Auger Electron Spectroscopy (AES) and X-ray Photoelectron Spectroscopy (XPS or ESCA) are well-established techniques for surface analysis and also (when combined with sputter depth profiling) for thin film and interface analysis.
This book is the first comprehensive treatment of the subject for over 10 years, during which time there have been many advances in instrumentation and performance, understanding of electron spectroscopy fundamentals, experimental methodology and data interpretation, which have markedly enhanced the capabilities of AES and XPS. All this new information is now integrated into a thoroughly up-to-date reference volume for the benefit of researcher and practical analyst alike.